2025
Chen Shouhong, Huang Zhentao, Wang Tao, Hou Xingna*. Ma, Jun. Wafer map defect recognition based on multi-scale feature fusion and attention spatial pyramid pooling[J]. Journal of Intelligent Manufacturing,2025,Vol.36(1): 271-284. (中科院二区，通讯作者)
Chen Shouhong, Lu Ying, Qin Guanxiang, Hou Xingna*,et al. CSPD-DETR: Real-time silicon crystalline photovoltaic cell surface defect detection transformer for building photovoltaic systems[J]. Journal of Building Engineering,2025,Vol.108: 112810. (中科院二区，通讯作者)
Chen Shouhong, Qin Guanxiang, Lu Ying,Hou Xingna*. A lightweight Hardware Trojan detection approach in the waveform diagram based on MobileViT and attention mechanism[J]. The Journal of Supercomputing,2025,Vol.81(4). (中科院三区，通讯作者)
Guo Ling, Xin Yao, Shi Minfang, Ma, Jun, Hou, Hou Xingna*, et al. A High Efficiency Metamaterial Solar Absorber in Full Energy Spectrum Based on Bilayer Circular Disk Array[J]. PLASMONICS,2025,. (中科院四区，通讯作者)
Xingna Hou,Yulan Zhao,Jinshuo Zhang & …Shouhong Chen. Integrated A* and DWA algorithms for emergency rescue path planning[J]. Cluster Computing,2025,Vol.28(16). (中科院三区，第一作者)
2024
Chen Shouhong, Huang Zhentao, Wang Tao, Hou Xingna*. Mixed-type wafer defect detection based on multi-branch feature enhanced residual module.[J]. Expert Systems with Applications,2024,Vol.242. (中科院一区，通讯作者)
Hou Xingna, Yi,et al. Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi Path DCNN[J]. IEEE Transactions on Semiconductor Manufacturing,2024,Vol.37(3): 1. (中科院三区，第一作者)
Hou Xingna, Qin,et al. A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm.[J]. Journal of Electronic Testing,2024,Vol.40(4): 419-433. (中科院四区，第一作者)
Chen Shouhong, Lu Ying, Qin Guanxiang, Hou Xingna*,et al. Polycrystalline silicon photovoltaic cell defects detection based on global context information and multi-scale feature fusion in electroluminescence images[J]. Materials Today Communications,2024,Vol.41: 110627. (中科院三区，通讯作者)
Chen Shouhong, Liu Meiqi, Hou Xingna*, et al. Wafer Map Defect Pattern Detection Method Based on Improved Attention Mechanism[J]. Expert Systems with Applications,2023,Vol.230: 120544. (中科院一区，通讯作者).
Chen Shouhong, WangTao, Huang Zhentao, Hou Xingna*. Detection method of Golden Chip-Free Hardware Trojan based on the combination of ResNeXt structure and attention mechanism[J]. Computers and Security,2023,Vol.134: 103428. (中科院二区，通讯作者)
Chen Shouhong, Wang Tao, Huang Zhentao, Hou Xingna*. Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field[J]. Journal of Electronic Testing: Theory and Applications (JETTA),2023,Vol.39: 621-629. (中科院四区，通讯作者)
发明专利（实用新型专利）： ZL202220008197.3，一种基于图像识别的机器学习电路板焊接装置，2022年08月19日
发明专利（发明专利）：ZL201910891187.1一种图像特征识别方法，2022年6月21日
